Elcometer 456 Integral Probe for Ferrous Surfaces – Pinip™ Technology, Scale 1

Description

Ferrous Substrate Plug In Integral Probe (PINIP™) | Scale 1 | Elcometer 456

Manufacturer: Elcometer

Part #: T456CF1P

Description: Designed to work with any of our Ferrous or Dual FNF Elcometer 456 Separate Gauges.
Probe attaches to a separate gauge to give it the performance and profile of an integral probe gauge.
Specifications:

• Range: 0-60 mils (0-1500µm)
• Accuracy*: ±1-3% or ±0.1 mil (±2.5µm)
• Resolution: 0.01 mil: 0-5 mils; 0.1mil: 5-60 mils (0.1µm: 0-100µm; 1µm: 100-1500µm)
• Minimum convex surface radius 4mm (0.16″)
• Minimum concave surface radius 60mm (2.36″)
• Minimum headroom 170mm (6.69″)
• Minimum sample diameter 4mm (0.16″)

Data Sheet

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